Scientific Imaging Equipment: Products like the ORCA®-Halo back-illuminated scientific sCMOS camera and ORCA®-Quest IQ qCMOS® camera feature high sensitivity and high resolution. They are suitable for cutting-edge research in life science fluorescence imaging and material analysis, capable of capturing complex life phenomena and material structures from the molecular to the tissue level.
Spectral Analysis Instruments: The FT-NIR Spectrometer C16511-01 and other products boast high-speed and compact design, suitable for industrial in-line process analysis. They can be widely applied in food testing, pharmaceutical production and other fields to improve detection efficiency and accuracy.
Semiconductor Inspection Systems: The TD Imaging failure analysis system adopts patented laser scanning technology, improving the signal-to-noise ratio by 38 times. The 670nm light source enhances the sensitivity for detecting metals like copper and aluminum by 4 times compared to 1300nm light sources. Data acquisition can be completed within 90 seconds, facilitating accurate defect localization in complex structure devices such as logic semiconductors.
Optoelectronic Sensors: Including InGaAs linear image sensors (such as G17225 series, G16823/G16824/G16825 series) and UV detection UVTRON® technology, applicable in scenarios like LiDAR, gas sensing, and medical diagnosis. Among them, the non-cooled InGaAs sensors can cover a wavelength range up to 2.1μm, meeting diverse detection needs.